M2LR-00-000-0 GE Panametrics M-Series moisture probe new

The GE Panametrics M2LR-00-000-0 is a calibrated M-Series moisture probe built on a thin-film aluminum-oxide (Al₂O₃) capacitive element that measures true absolute humidity — i.e. water-vapour pressure — in gases and non-aqueous liquids, standard-calibrated over −80…+20 °C dew/frost point with data extended to −110 °C (accuracy ±2 °C above −65 °C, ±3 °C from −110 to −66 °C, repeatability ±0.5 °C, response < 5 s to 63 % of a step change).

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Description

Technical Specifications
  • Brand
    GE Panametrics
  • Model
    M2LR-00-000-0
  • Product Name
    M‑Series Aluminum Oxide Trace Moisture Probe
  • Place of Origin
    United States
  • Customs HS Code
    9025805000
  • Power Supply
    4‑20 mA
  • Dimensions
    160 mm × 40 mm × 10 mm
  • Weight
    0.20 kg
  • Operating Temperature
    ‑40℃ to +70℃
  • Storage Temperature
    ‑50℃ to +85℃
  • Warranty
    1 yes
  • Product Status
    new

Advantages of GE Panametrics M2LR-00-000-0

Product Type: Aluminum-oxide moisture probe applied for trace moisture measurement in gas and non-aqueous liquid media

Provides high-precision absolute humidity measurement with superior sensitivity for trace moisture within a wide dynamic measurement range.

Features rapid response and excellent long-term calibration stability, which greatly lowers on-site recurring recalibration maintenance efforts.

Each probe is individually factory-calibrated with NIST-traceable calibration data, guaranteeing measurement reliability for industrial processes with strict quality requirements.

Achieves intrinsic safety when used together with certified electronic units or zener barriers, making it applicable for gas-related operations in hazardous locations.

Supports flexible installation solutions: direct in-situ insertion into process pipelines or integration with sample conditioning systems.

Equipped with optional integrated temperature sensor to compensate temperature-dependent drift and enhance measurement accuracy amid fluctuating process temperatures.

Adopts durable mechanical design, delivering stable continuous service for petrochemical, natural gas, industrial gas, power and pharmaceutical industries.

Interoperable with Panametrics moisture analyzer controllers. Simple twisted-pair wiring supports long-distance layout between probe and main unit to reduce cabling expenditure.

Detects actual absolute humidity rather than relative humidity, effectively mitigating measurement errors caused by hysteresis under variable operating conditions.

M2LR-00-000-0.jpg

Advantages of GE Panametrics M2LR000000

Product Type: Aluminumoxide moisture probe applied for trace moisture measurement in gas and nonaqueous liquid media

Provides highprecision absolute humidity measurement with superior sensitivity for trace moisture within a wide dynamic measurement range.

Features rapid response and excellent longterm calibration stability, which greatly lowers onsite recurring recalibration maintenance efforts.

Each probe is individually factorycalibrated with NISTtraceable calibration data, guaranteeing measurement reliability for industrial processes with strict quality requirements.

Achieves intrinsic safety when used together with certified electronic units or zener barriers, making it applicable for gasrelated operations in hazardous locations.

Supports flexible installation solutions: direct insitu insertion into process pipelines or integration with sample conditioning systems.

Equipped with optional integrated temperature sensor to compensate temperaturedependent drift and enhance measurement accuracy amid fluctuating process temperatures.

Adopts durable mechanical design, delivering stable continuous service for petrochemical, natural gas, industrial gas, power and pharmaceutical industries.

Interoperable with Panametrics moisture analyzer controllers. Simple twistedpair wiring supports longdistance layout between probe and main unit to reduce cabling expenditure.

Detects actual absolute humidity rather than relative humidity, effectively mitigating measurement errors caused by hysteresis under variable operating conditions.

 M2LR-00-000-0 (2).jpg

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